The QWED team participated in a technical meeting within the 5GFoil project, hosted at Circuit Foil in Luxembourg. The meeting focused on coordination of ongoing activities, alignment of project milestones, and technical exchange between partners.

The discussions addressed key aspects of microwave characterization of conductive materials and thin films, with particular emphasis on applications in high-frequency and millimeter-wave systems. Special attention was given to measurement methodologies enabling reliable extraction of surface resistance and effective conductivity, as well as their integration with numerical modeling.

The meeting provided a platform to compare experimental approaches, validate assumptions, and refine procedures for upcoming measurement campaigns. Topics included the impact of surface roughness on RF performance, frequency-dependent behavior of conductive materials, and the relationship between DC and microwave properties.

Such interactions are essential for ensuring consistency and traceability of results across partners, as well as for advancing measurement techniques toward industrial applicability.

We would like to thank Circuit Foil for hosting the meeting and for providing an open and collaborative technical environment.