Fabry-Perot Open Resonator

Dielectrics

Non-contact FPOR measurements deliver ε and tanδ of bulk dielectrics.

Polymers

The open resonator quantifies ε and tanδ of low-loss polymer sheets without electrodes.

Ultra-Thin FIlms

FPOR resolves dielectric properties of films just a few µm thick by analysing minute Q-factor shifts,

Ω

Higly-Resistive Semiconductors

extracts bulk resistivity of semiconductors like Si or SiC.

  • Frequency range:
10 – 130 GHz*
  • Dielectric constant:
Dk = 1 – 15 (achievable accuracy ± 0.2 %)
  • Loss tangent:
Df > 5 × 10–6 (achievable accuracy ± 2 %)
  • Sample thickness:
1 µm – 3 mm
  • Sample diameter:
105 – 145 mm **
  • Measurement time:
> 1 minute
  • Temperature:
room, 0 – 80 °C (on request)
  • In-plane anisotropic materials can be measured
  • Fully automated and software-controlled measurement

*Available also in various frequency-range configurations (e.g. 10 – 26.5 GHz, 10 – 43 GHz, 10 – 50 GHz, 10 – 67 GHz, 10 – 110 GHz, etc.)
** minimum required sample size may differ depending on chosen measurement frequency range

Overview

Fig. 1 Overview of FPOR measurement capabilities (10–170 GHz).

Repeatability

Fig. 2 Repeatability of fused silica measurements.

Polymers

Fig. 4 Polymer materials example.

In-plane anisotropy

Fig. 9 Quartz anisotropy.

Highly-resistive semiconductors

Fig. 12 Silicon measurements.

Thin films on substrates

Fig. 16 COP substrate with thin film – Dk and Df.
Fig. 17 Loss tangent extraction.
Fig. 18 FEP substrate with thin film.

Link to contact us via form:

Dielectric measurements with a Fabry-Perot open resonator (up to 130 GHz)

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