Single-Post Dielectric Resonator
Conductive Composites
the dielectric properties of composite films just a few micrometers thick
SemiconductorS
The SiPDR resonator extracts the bulk resistivity of semiconductor wafers (e.g., SiC) from 10⁻⁴ Ω·cm up to several hundred Ω·cm.
Metamaterials
Contact‑less SiPDR measurements deliver dielectric loss data for engineered negative‑index metamaterial structures.
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5 GHz (other bands on request) |
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10-4 – 103 Ω·cm |
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10-1 – 2 × 104 Ω/sq (accuracy ± 2 %) |
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few µm to 1 mm |
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30 – 90 mm |
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≪ 1 minute |
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0 – 110 °C |
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