2D inverted Single-Post Dielectric Resonator
Conductive Composites
the dielectric properties of composite films just a few micrometers thick
SemiconductorS
The SiPDR resonator extracts the bulk resistivity of semiconductor wafers (e.g., SiC) from 10⁻⁴ Ω·cm up to several hundred Ω·cm.
Metamaterials
Contact‑less SiPDR measurements deliver dielectric loss data for engineered negative‑index metamaterial structures.
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10 GHz |
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10⁻⁴ – 10³ Ω·cm |
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10⁻¹ – 2 × 10⁴ Ω/sq |
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few µm up to 1 mm |
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up to 100 × 100 mm |
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