Q-Choke Split Cylinder Resonator

Dielectrics

Non-contact FPOR measurements deliver ε and tanδ of bulk dielectrics.

Polymers

The open resonator quantifies ε and tanδ of low-loss polymer sheets without electrodes.

Ultra-Thin FIlms

FPOR resolves dielectric properties of films just a few µm thick by analysing minute Q-factor shifts,

Ω

Higly-Resistive Semiconductors

extracts bulk resistivity of semiconductors like Si or SiC.

  • Operating frequency:
10 GHz (higher frequencies coming soon…)
  • Dielectric constant:
1 – 15 ( δDk ± 0.2%)
  • Loss tangent:
> 1 × 10−6 ( δDf ± 2%)
  • Sample size:
40 × 40 mm – 100 × 100 mm
  • Thickness:
5 µm to 4 mm (e.g., sapphire)
  • Supported standards:
IPC TM-650 2.5.5.13
  • Software-controlled measurement


The Q-Choke, as implemented in the Q-SCR resonator, is covered by the following patent applications:

  • W. Gwarek, ELECTROMAGNETIC RESONATING STRUCTURE AND A METHOD OF MEASURING A MATERIAL PARAMETER OF A FLAT SAMPLE, European Patent Application no., EP23461651.4, of 2023-09-18, published as EP4524554A1, EP Bulletin 2025/12;
    Link
  • W. Gwarek, ELECTROMAGNETIC RESONATING STRUCTURE AND A METHOD OF MEASURING A MATERIAL PARAMETER OF A FLAT SAMPLE, International Patent Application no. PCT/IB2024/056934, of 2024-07-17, published as WO 2025/062194A1;
    Link

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