Q-Choke Split Cylinder Resonator
Dielectrics
Non-contact FPOR measurements deliver ε and tanδ of bulk dielectrics.
Polymers
The open resonator quantifies ε and tanδ of low-loss polymer sheets without electrodes.
Ultra-Thin FIlms
FPOR resolves dielectric properties of films just a few µm thick by analysing minute Q-factor shifts,
Higly-Resistive Semiconductors
extracts bulk resistivity of semiconductors like Si or SiC.
|
10 GHz (higher frequencies coming soon…) |
|
1 – 15 ( δDk ± 0.2%) |
|
> 1 × 10−6 ( δDf ± 2%) |
|
40 × 40 mm – 100 × 100 mm |
|
5 µm to 4 mm (e.g., sapphire) |
|
IPC TM-650 2.5.5.13 |
|
The Q-Choke, as implemented in the Q-SCR resonator, is covered by the following patent applications:
- W. Gwarek, ELECTROMAGNETIC RESONATING STRUCTURE AND A METHOD OF MEASURING A MATERIAL PARAMETER OF A FLAT SAMPLE, European Patent Application no., EP23461651.4, of 2023-09-18, published as EP4524554A1, EP Bulletin 2025/12;
Link - W. Gwarek, ELECTROMAGNETIC RESONATING STRUCTURE AND A METHOD OF MEASURING A MATERIAL PARAMETER OF A FLAT SAMPLE, International Patent Application no. PCT/IB2024/056934, of 2024-07-17, published as WO 2025/062194A1;
Link